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  • 产品名称:双电四探针方阻电阻率测试仪

  • 产品型号:FT-340
  • 产品厂商:瑞柯仪器
  • 产品价格:0
  • 折扣价格:0
  • 产品文档:
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简单介绍:
双电四探针方阻电阻率测试仪,广泛用于覆盖膜;导电高分子膜,高、低温电热膜;隔热、防辐射导电窗膜 导电(屏蔽)布、装饰膜、装饰纸;金属化标签、合金类箔膜;熔炼。FT-340系列双电测电四探针方阻电阻率测试仪还可以用于烧结、溅射、涂覆、涂布层,电阻式、电容式触屏薄膜;电极涂料,其他半导体材料、薄膜材料方阻测试。双电四探针方阻电阻率测试仪
详情介绍:

双电四探针方阻电阻率测试仪


一.广泛用于Widely used

覆盖膜;导电高分子膜,高、低温电热膜;隔热、防辐射导电窗膜 导电(屏蔽)布、装饰膜、装饰纸;金属化标签、合金类箔膜;熔炼、烧结、溅射、涂覆、涂布层,电阻式、电容式触屏薄膜;电极涂料,其他半导体材料、薄膜材料方阻测试

双电四探针方阻电阻率测试(shi)仪

硅晶块、晶片电阻率及扩散层、外延层、ITO导电箔膜、导电橡胶等材料方块电阻  半导体材料/晶圆、太阳能电池、电子元器件,导电薄膜(ITO导电膜玻璃等),金属膜,导电漆膜,蒸发铝膜,PCB铜箔膜,EMI涂层等物质的薄层电阻与电阻率  导电性油漆,导电性糊状物,导电性塑料,导电性橡胶,导电性薄膜,金属薄膜,抗静电材料, EMI 防护材料,导电性纤维,导电性陶瓷等,提供中文或英文两种语言操作界面选择,满足国内及国外客户需求.

双电(dian)四(si)探针方阻电(dian)阻率测试仪

covering film;Conductive polymer film. high and low temperature electric film;Insulation. anti-radiation conductive film (shielding) cloth. decorative film. decorative paper.Metallized labels and alloy foil films.Smelting. sintering. sputtering. coating. Coating layer. resistance. capacitive touch screen.Electrode coating. other semiconductor materials. thin-film material resistance testing.

Silicon block. chip resistance rate and diffusion layer. epitaxial layer. ITO conductive foil. conductive rubber materials such as square resistance .semiconductor materials/wafer. solar cells. electronic components. conductive film (ITO conductive film glass. etc.). metal film.Conductive paint film, evaporation aluminum membrane. PCB copper foil membrane. EMI coating materials such as sheet resistance and resistivity of conductive paint. conductive paste and conductive plastic. conductive rubber. conductive film. metal film. anti-static materials. EMI shielding materials. conductive fiber. conductive ceramics. etc.. provide the interface to choose Chinese or English two languages. Meet the demand of domestic and foreign customers.

双电(dian)四探针方(fang)阻电(dian)阻率测试仪(yi)

二.描述Description

采用四探针组合双电测量方法,液晶显示,自动测量,自动量程,自动系数补偿.高集成电路系统、恒流输出;选配:PC软件进行数据管理和处理.

双电测数字式四探针测试仪是运用直线或方形四探针双位测量。该仪器设计符合单晶硅物理测试方法国家标准并参考美国 A.S.T.M 标准。利用电流探针、电压探针的变换,进行两次电测量,对数据进行双电测分析,自动消除样品几何尺寸、边界效应以及探针不等距和机械游移等因素对测量结果的影响,它与单电测直线或方形四探针相比,大大提高**度,特别是适用于斜置式四探针对于微区的测试。

Adopt  four  probe combination double electric measurement method. Liquid crystal display. automatic measurement. automatic range. Automatic coefficient  compensation. High integrated circuit system. constant current output;optional to buy: PC software for data management and processing.

规格型号/ model

FT-341

FT-342

FT-343

FT-345

FT-346

FT-347

1.方块电阻sheet resistance

10-52×105Ω/□

10-42×105Ω/□

10-32×105Ω/□

10-32×104Ω /□

10-22×105Ω/□

10-22×104Ω/□

2.电(dian)阻率Resistivity

10-62×106Ω-cm

10-52×106Ω-cm

10-42×106Ω-cm

10-42×105Ω-cm

10-32×106Ω-cm

10-32×106Ω-cm

3.测(ce)试(shi)电流Test current

0.1μA.μA.0μA100µA1mA10mA100mA

1μA10μA100µA1mA10mA100mA

0.1μA.μA10μA100µA1mA10mA100 mA

1μA10μA100µA1mA10mA100mA

0.1μA1μA10μA100µA1mA10mA100mA

1μA10μA100µA1mA10mA100mA

4.电流(liu)精度(du)Current

±0.1% accuracy

±0.2%  accuracy

±0.2%  accuracy

±0.3%  accuracy

±0.3%  accuracy

±0.3%  accuracy

5.电阻精度Resistance

≤0.3% accuracy

≤0.3% accuracy

≤0.3% accuracy

≤0.5% accuracy

≤0.5% accuracy

≤0.5% accuracy

6.显示(shi)读数display

大屏液晶(jing)显(xian)示:电阻、电阻率(lv)、方阻、温度(du)、单位换(huan)算、温度(du)系数、电流、电压(ya)、探针形(xing)状、探针间距、厚度(du) 、电导率Large screen LCD: Resistance. resistivity. sheet resistance. temperature. unit conversion.temperature coefficient. current. voltage. probe shape. probe spacing. thickness. conductivity

7.测试方式(shi)

test mode双电测量Double electrical measurement

8.电源(yuan)Power

输入: AC 220V±10%.50Hz 耗(hao):<30W

9.误差errors

整机不确定性(xing)Machine uncertain≤3%(标(biao)准(zhun)样片结果)/≤3%standard samples

10.选购功(gong)能choose to buy

选购1.pc软件; 选(xuan)购2.方形探(tan)头; 选购3.直(zhi)线(xian)形探头; 选购4.测试(shi)平台;5.标准(zhun)电阻.1.pc software; 2. square probe; 3. linear probe; 4. test platform

11.测试(shi)探头(tou)test probe

探针间距选购:1mm2mm3mm三种规格; 探针(zhen)材质(zhi)选购:碳(tan)化钨(wu)针(zhen);白钢针;镀金(jin)磷铜半球形针Optional probe spacing: 1mm2mm3mm in three sizes.Select probe material: tungsten carbide needle. white steel needle. gilded copper hemispherical needles.

Double electric digital four probe tester is used to measure two bits of a straight line or square four probe.The instrument is designed to meet the national standards of the single-crystal silicon physical test method and the American A.S.T.M standard.Using transformation of current probe and  voltage probe to process two electric measurement. Double electrical analysis of data.automatically eliminate the sample geometry size and boundary effect and probe not equidistant and moving machinery. such as the factors influence on the measured results. Compared with the single electrical measuring linear or square four probe. greatly improve the accuracy. Especially suitable for diagonal four probe for micro area of the test.

.技术参数Technical Parameters

双电(dian)四探针方阻电(dian)阻率测试仪

配套方案:解决各材(cai)料(liao)状(zhuang)态(tai) --固态(tai)、液(ye)态(tai)、气态(tai)、颗粒状(zhuang)电阻(zu)、电阻(zu)率、电导(dao)率测量(liang)

ROOKO瑞柯品牌-------专注于新材料测量与分析仪器解决方案  

----解决材料:导体、半导体、绝缘材料常温及高温等环境下电性能分析.

----J9九游会AG 一(yi)直(zhi)在做:研发、生产、销售、租赁(lin)、实验室样品分析及后延(yan)扩(kuo)展服务

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